Interferometric Optics

Generalized N-Slit Interferometric Calculations

Numerical calculations, near or far field, for the interference produced by the interaction of laser light with an array of N-slits. These computations are particularly applicable to the characterization of N-slit interferometers. Input paramenters include: wavelength, slit dimensions, number of slits, distance from the slit array, or grating, to the interference plane. Graphical output includes the central and secondary diffraction orders.

An additional application is the characterization of the emission transverse-mode structure in laser oscillators and/or laser resonators. In other words, the cavity and emission beam geometry can be optimized to achieve single-transverse-mode emission at maximum efficiency. This is a powerful design tool that saves time, resources, and effort in laser architecture and engineering.




Note: the interferometric calculations mentioned here are performed using equations derived from the application of Dirac's quantum notation to propagation in a given geometry. The principles of this approach are described in F. J. Duarte, Tunable Laser Optics, 2nd Edition (CRC, New York, 2015) (see Chapters 2 and 7). This particular interferogram was first published in F. J. Duarte, On a generalized interference equation and interferometric measurements, Opt. Commun. 103, 8-14 (1993). Comparisons between theory and experiments, in the NSLI configuration, have been performed for even values (N = 2, 4, 6...) and odd values (N = 3, 5, 7...) of N. This includes the cases of two-slit interference, three-slit interference, four-slit interference, etc. (Duarte, 1991, 2002, 2005).

References
  • F. J. Duarte and D. J. Paine, Quantum mechanical description of N-slit interference phenomena, in Proceedings of the International Conference on Lasers '88, R. C. Sze and F. J. Duarte (Eds.) (STS, McLean, Va, 1989) pp. 42-47.
  • F. J. Duarte, Dispersive dye lasers, in High Power Dye Lasers, F. J. Duarte (Ed.) (Springer-Verlag, Berlin, 1991) Chapter 2.
  • F. J. Duarte, Electro-optical interferometric microdensitometer system, US Patent 5255069 (1993).
  • F. J. Duarte, On a generalized interference equation and interferometric measurements, Opt. Commun. 103, 8-14 (1993).
  • F. J. Duarte, Interferometric imaging, in Tunable Laser Applications, F. J. Duarte (Ed.) (Marcel-Dekker, New York, 1995) Chapter 5.
  • F. J. Duarte, Interference, diffraction, and refraction, via Dirac's notation, Am. J. Phys. 65, 637-640 (1997).
  • F. J. Duarte, Interference of two independent sources, Am. J. Phys. 66, 662-663 (1998).
  • F. J. Duarte, Secure interferometric communications in free space, Opt. Commun. 205, 313-319 (2002).
  • F. J. Duarte, Tunable Laser Optics, 2nd Edition (CRC, New York, 2015) Chapter 2.
  • F. J. Duarte, Comment on "Reflection, refraction, and multislit interference," Eur. J. Phys. 25, L57-L58 (2004).
  • F. J. Duarte, Secure interferometric communications in free space: enhanced sensitivity for propagation in the metre range, J. Opt. A: Pure Appl. Opt. 7, 73-75 (2005).
  • F. J. Duarte, Interferometric imaging, in Tunable Laser Applications, 2nd Ed., F. J. Duarte (Ed.) (CRC, New York, 2009) Chapter 12.
  • F. J. Duarte, T. S. Taylor, A. B. Clark, and W. E. Davenport, The N-slit interferometer: an extended configuration, J. Opt. 12, 015705 (2010).
  • F. J. Duarte, Triple-slit experiment, Optics & Photonics News 22(12), 7 (2010).
  • F. J. Duarte, T. S. Taylor, A. M. Black, W. E. Davenport, and P. G. Varmette, N-slit interferometer for secure free-space optical communications: 527 m intra interferometric path length, J. Opt. 13, 035710 (2011).
  • F. J. Duarte, T. S. Taylor, A. M. Black, and I. E. Olivares, Diffractive patterns superimposed over propagating N-slit interferograms, J. Mod. Opt. 60, 136-140 (2013).
  • F. J. Duarte, Interferometric imaging, in Tunable Laser Applications, 3rd Ed., F. J. Duarte (Ed.) (CRC, New York, 2016) Chapter 10.

Keywords: N-slit interference, N-slit interferometer, N-slit interferometry, two-slit interference, two-slit interferometer, two-slit interferometry, double-slit interference, double-slit interferometer, double-slit interferometry, three-slit interference, three-slit interferometer, three-slit interferometry, triple-slit interference, triple-slit interferometer, triple-slit interferometry, four-slit interference, four-slit interferometer, four-slit interferometry

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Published on the 15th of June, 2006; updated on the 31st of October, 2018.